Hitachi s 4700

OEM Model Description. HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom.

See full list on mtu.edu S-4700形走査電子顕微鏡の応用 (331KB) 詳細リンク: sem100: 概要: SEMは1965年の製品化以来めざましい進歩を遂げてきました。最近では、電子光学系の改良を合わせて、PC搭載によるGUI環境下での操作性向上と機能拡張が図られています。match case limit results 1 per page hitachi 4700 fe-sem cold field emmision 2 starting conditions 3-4 specimen loading 5 sample insertion 6-7 sample withdrawal 7 set image parameters 8-10 obtaining an image 11 alignment 12 general operation 13-14 image acquisition 15 backscatter electron imaging 16 computer startup and gun flash procedure …View Photo Gallery Download Standard Operating Procedures The Hitachi S-4700 Scanning Electron Microscope (SEM) is an extremely powerful method for surface ...ment is shown in Figure S 1(a). To study the microstructure, samples are vertically sectioned, polished to a 1 µm finish with diamond suspension and thermally etched at 1200°C for 1 h. The etched samples are Pt-coated and observed by Scanning Electron Microscopy (SEM, Hitachi S-4700,

The structural changes of CS after NaOH pretreatment were determined by a Hitachi S-4700 (Japan) scanning electron microscopy (SEM). The pH value was measured by pH meter (Mettler Toledo, USA) equipped with a le438 electrode. ... Rincon, B., Heaven, S., Banks, C.J., Zhang, Y.: Anaerobic digestion of whole-crop winter wheat silage for …The Hitachi S-4700 Scanning Electron Microscope (SEM) is an extremely powerful method for surface analysis, allowing high depth-of-field and high magnification imaging. Topographical features, morphology, compositional differences, and the presence and location of defects can be examined in a wide range of sample types. This tool is a cold ... Jul 16, 2015 · Arizona State University NanoFab HITACHI S-4700 FESEM .....Hitachi Service contact: Phone: 800-253-3053 (Ser. No. 9318-08) EDAX Service contact: Phone: 800-535-3329: No longer under HITACHI HITACHI 5 HITACHI 5.OAh HITACHI 22mm WR22SE HITACHI 25mm WR25SE HITACHI HITACHI WR ISSA Oct 11, 2014 · The Hitachi S4700 is a Field Emission Scanning Electron Microscope It has a resolution of 2.3 nm, about 0.00003 the size of a human hair. Magnification range is 250x-500,000x. Typical magnifications used 250x-200,000x Samples include: • Thin films • Ceramics • Metals • Biological • Composites • Polymers 76.6 m. objective lens in the Hitachi S-4700 is a “snorkel” lens (Figure 2) which has low aberrations (described below), and it can accommodate large specimens. In addition, it can simultaneously accommodate both a lower (i.e., an E-T) and an upper (through-the-lens) secondary electron detector as described below, providing valuable

The Hitachi S-4700 Scanning Electron Microscope (SEM) is an extremely powerful method for surface analysis, allowing high depth-of-field and high magnification imaging. Topographical features, morphology, compositional differences, and the presence and location of defects can be examined in a wide range of sample types.A Hitachi S-4700 scanning electron microscope (SEM) was used to study the morphology of the silica powders. Specific surface areas of silica powders were determined by N 2 adsorption (BET) using ASAP 2020M+C instrument (Micrometrics Instrument Co.).Focus on an area at high magnification. (Use the magnification at which you will be imaging, as charging is related to magnification strength.) Let the beam sit on the sample for a few seconds. Reduce the magnification and observe the sample. If there is a bright spot, the sample is experiencing negative charging; lower the voltage. HITACHI. S-4700. Field Emission Scanning Electron Microscope (FE-SEM), 8" Main unit: FE tip (4) BARION Ion pumps Turbo pump: BOC EDWARDS STP 301H Stage: Type 2 (5 Axis motor) (2) SE Detectors Ion pump power: Electron EDS, EDAX (Normal operation) included Display unit: Monitor: LG LCD 19" HP COMPAQ Deskpro computer Stage control Image control ... Hitachi S-4700 FE-SEM; FE-SEM Operating Procedure; Also in this section. Instrumentation. FEI 200kV Titan Themis STEM; Hitachi FB-2000A FIB; Hitachi S-4700 FE-SEM ...

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Make a request. Popular Product. HITACHI. S-4700 Type II. Scanning Electron Microscope (SEM) Magnification: 25x - 500,000x Sample size:100mm (Diameter) x 15mm. 12. Popular Product. HITACHI S-4700 is a scanning electron microscope (SEM) that is used for visualizing nanoscale objects and materials. It provides high resolution images with unsurpassed image sharpness, comparable to conventional laboratory light microscopes without the need for applied contrast agents. The SEM operates in two modes: Scanning Mode and Point Mode.Triple Jaw Leech. Macrobdella decora, commonly known as the North American Medicinal Leech, is found throughout the northern half of North America. It possesses 3 jaws (seen here), with 50 - 60 denticles (or teeth) on each jaw. When the leech bites, the jaws are moved in a sawing motion to open the wound. Anticoagulants in the leech's saliva ...SEM & TEM : HITACHI S-4700 - Hitachi S-4700 Type 1 with EDAX EDS System: Resolution 1.5 nm with 15 kV beam, 12 mm working distance 2.1 nm with 1 kV bean, 1.5 mm working distance Magnification High mag mode: 100x – 500 kx Low mag mode: 20x – 2 kx Electron Optics: Electron gun: Cold cathode field emission type …

SEM Hitachi S4700 / EDAX. View Photo Gallery. Download Standard Operating Procedures. The Hitachi S-4700 Scanning Electron Microscope (SEM) is an extremely powerful method for surface analysis, allowing …The Hitachi S-4700 Field Emission Scanning Electron Microscope is equipped with a field emission single crystal tungsten electron gun. The SEM is used for high resolution imaging up to 500,000x. The scope is equipped with an EDAX energy dispersive x-ray unit capable of determining light elements down to Boron. The structures and morphologies of copper sulphide layers were characterised by X-ray diffraction (XRD, Rigaku, Japan), scanning electron microscopy (SEM, Japan Hitachi S-4700) and cross-sectional transmission electron microscopy (TEM, H-800). Mechanical properties were evaluated using a material testing machine (MTS Systems …SEM Hitachi S-4700 user manual. 1. Warnings and recommendations. Be sure to read the following remarks: 1.1. This equipment belongs to VAN Partners. Let's handle it with much care, 1.2. Before exchanging the sample, always check that the stage is in its initial position: The morphologies of the samples were observed by scanning electron microscopy (SEM, Hitachi S-4700) which was operated at 20.0 kV. Energy-dispersive spectrum (EDS) characterization was performed with an EDX system attached to SEM. X-ray photoelectron spectroscopy (XPS, ...HITACHI S-4700 SCANNING ELECTRON MICROSCOPE WITH EDAX X-RAY OPTION. Hitachi S-4700 FE SEM Field Emmission Scanning Electron Microscope with EDAX X-Ray Option. INCLUDES CENTAURUS DETECTOR, IBSS GROUP CV10X-DS ASHER RONTEC, XFLASH DETECTOR. Still in the Lab in working condition. It has been under Hitachi Service Contract. Hitachi S-4700 FE-SEM; FE-SEM Operating Procedure; Also in this section. Instrumentation. FEI 200kV Titan Themis STEM; Hitachi FB-2000A FIB; Hitachi S-4700 …This tour of the Hitachi S-4700 Scanning Electron Microscope software features ten different control functions. Numbers indicate the suggested order to explore. 1. HV Control Clicking anywhere on the grey region opens the HV Control window. The accelerating voltage and beam current, I e, values depend on your sample and research objectives.HITACHI S-4700 is a scanning electron microscope (SEM) that is used for visualizing nanoscale objects and materials. It provides high resolution images with unsurpassed image sharpness, comparable to conventional laboratory light microscopes without the need for applied contrast agents. The SEM operates in two modes: Scanning Mode and Point Mode. S-4700形走査電子顕微鏡の応用 (331KB) 詳細リンク: sem100: 概要: SEMは1965年の製品化以来めざましい進歩を遂げてきました。最近では、電子光学系の改良を合わせて、PC搭載によるGUI環境下での操作性向上と機能拡張が図られています。중고 FE-SEM 의 장점은? 지에스이엠 에서 판매하는 H사의 중고 FE-SEM 은 Cold Type 의 빔 소스를 사용함으로써 교체비용에 무리가 없습니다. 일반적으로 FE-SEM 은 FE Tip 을 교체하면서 발생하는 고가의 소모품 구매/유지관리 비용 때문에 부담이 있습니다. Cold type 의 빔 ...

Hitachi S-4700 FE-SEM. After selecting Condenser Alignment, the image begins to shift in both the X (horizontal) and Y (vertical) directions. To correct this, it is easiest to eliminate shift first in one direction and then the other. Turn the Y alignment knob until the image shifts only horizontally in the X direction.

Tang’s group demonstrated that the prepared g-C 3 N 4 /CdS:Mn nanocomposites could be used as a PEC immunosensor for the detection of prostate specific antibody (PSA) ... Dimension ICON), field emission SEM (FE-SEM; Hitachi S-4700), and the FEI Talos 200F TEM (200KV).The scanning electron microscopy (SEM) images were obtained using a HITACHI S-4700 field emission SEM (Hitachi, Tokyo, Japan). The surface characteristics were measured on a surface area and porosity analyzer ASAP 2020 HD88 (Micromeritics, Atlanta, Georgia, USA). Thermogravimetric analysis (TGA) was carried out on …objective lens in the Hitachi S-4700 is a “snorkel” lens (Figure 2) which has low aberrations (described below), and it can accommodate large specimens. In addition, it can simultaneously accommodate both a lower (i.e., an E-T) and an upper (through-the-lens) secondary electron detector as described below, providing valuable3. Click on the Signal Control icon in the bottom right of the screen. Check the SE/BSE box and using the slider, adjust the voltage -50 to -70 V. Next, adjust the brightness and contrast and re-focus the image. 4. The default settings are: Emission current = 10 µA. Condenser Lens 1 = 5.0 to 8.0. Aperture = 50 µm.Hitachi S-4700 FE-SEM; FE-SEM External Components; FE-SEM Front Panel; Also in this section. Instrumentation. FEI 200kV Titan Themis STEM; Hitachi FB-2000A FIB; Focus on an area at high magnification. (Use the magnification at which you will be imaging, as charging is related to magnification strength.) Let the beam sit on the sample for a few seconds. Reduce the magnification and observe the sample. If there is a bright spot, the sample is experiencing negative charging; lower the voltage.The S-4700 Cold Field Emission SEM incorporates a set of electrodes and plates positioned in the objective lens upper pole piece in close proximity to the upper secondary detector (figure 1). When a positive voltage is applied to the electrode plates, a high yield of secondary and backscattered electrons spiral up the column of the objective ...hitachi 4700 fe-sem cold field emmision starting conditions specimen loading sample insertion sample withdrawal set image parameters obtaining an image alignment general…

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3. Click on the Signal Control icon in the bottom right of the screen. Check the SE/BSE box and using the slider, adjust the voltage -50 to -70 V. Next, adjust the brightness and contrast and re-focus the image. 4. The default settings are: Emission current = 10 µA. Condenser Lens 1 = 5.0 to 8.0. Aperture = 50 µm.Hitachi FB-2000A FIB; Hitachi S-4700 FE-SEM. Introduction; Basic Science; External Components; Internal Components; Software; Safety Procedures; Operating Procedure; …Hitachi S4700 FE-SEM is a powerful tool for topographic analysis at nano-scale levels, which uses windows XP-based computerized operating system with the high- ...走査型電子顕微鏡;. 走査型電子顕微鏡(Hitachi S4700)：微細組織の観察ができます。 The Hitachi S-4700 Field Emission Scanning Electron Microscope is a high ...SEM. The Hitachi S-4700 is a cold field emission high resolution scanning electron microscope. Capabilities include secondary electron (SE) and backscattered ...HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. …HITACHI S-4700 is a powerful and reliable scanning electron microscope (SEM), widely used in research and industry for its versatile imaging modes, powerful imaging capabilities, increased convenience, and enhanced safety features such as its triple safety cabinet, allowing for imaging with nanoscale resolution.Hitachi S-4700 FE-SEM; FE-SEM External Components; Also in this section. Instrumentation. FEI 200kV Titan Themis STEM; Hitachi FB-2000A FIB; Hitachi S-4700 FE-SEM ...Hitachi S 4700 Scanning Electron Microscope (SEM) Asset # : 35013. Equipment Make: Hitachi. Equipment Model: S-4700. Type: Scanning Electron Microscope (SEM) Wafer Size: Equipment Configuration: 1. Type I 2. Was under OEM service contract 3. Does not include: – Pumps or Chiller – EDX.match case limit results 1 per page hitachi 4700 fe-sem cold field emmision 2 starting conditions 3-4 specimen loading 5 sample insertion 6-7 sample withdrawal 7 set image parameters 8-10 obtaining an image 11 alignment 12 hitachi 4700 fe-sem cold field emmision 2 starting conditions 3-4 specimen loading 5 sample insertion 6-7 ...SEM & TEM : HITACHI S-4700 - : Metrology. Buy Sell. How It Works. Dashboard. Log In. Register. Contact Us. No Results. Back to Previous. HITACHI S-4700. Created On. November 17th, 2020. Guaranteed Accurate as of. 8 months ago. Copied! Share. November 17th, 2020. 8 months ago. Copied! Share. See Full Gallery (0 Photos) Make Offer. … ….

Feb 28, 2019 · The Hitachi S-4700 SEM is equipped with a snorkel lens that allows for both an upper through-the-lens (TTL) detector and a lower Everhart-Thornley (E-T) detector. Accelerating voltage = 0.5 to 30 kV. Magnification up to 500,000x. Resolution of: 1.5nm at 15kV accelerating voltage and 12mm working distance 2.5nm at 1kV accelerating voltage and 2 ... At Bridge Tronic Global, we have 'Hitachi S 4700 Type I Cold Field Emission Gun Scanning Electron Microscope (Cold FEG SEM) 60685' available for sale. Contact us now. ... Equipment Model: S 4700. Type: Type I Cold Field Emission Gun Scanning Electron Microscope (Cold FEG-SEM) Wafer Size: Equipment Configuration:Despite over 67% Earth’s surface being covered by water bodies, ... HITACHI S-4700). The static contact angles of the droplets (5 μL) were measured using an FDSA Magic Droplet-100 contact angle ...Hitachi S-4700-II — high-resolution, high-vacuum SEM; FEI Quanta 400F — high ... Specimen preparation is an important part of electron microscopy and an array ...Focus on an area at high magnification. (Use the magnification at which you will be imaging, as charging is related to magnification strength.) Let the beam sit on the sample for a few seconds. Reduce the magnification and observe the sample. If there is a bright spot, the sample is experiencing negative charging; lower the voltage. SEM / TEM / FIB : HITACHI S-4700 - : See Full Gallery (0 Photos) No Longer AvailableHitachi HL7800M E-Beam Litho (6 inch mask) Hitachi HL8000M E-Beam Litho (6 inch mask) Hitachi S-6280H CD SEM. Hitachi S5200 FE SEM with EDX. HITACHI 6280H (SPARES) SORD Computer for cd sem system. Hitachi 545-5516 7 Channel Power Supply module. Hitachi 545-5522 VG board for CD SEM. Hitachi RS4000 Defect Review SEM.SEM & TEM : HITACHI S-4700 - Hitachi S-4700 Type 1 with EDAX EDS System: Resolution 1.5 nm with 15 kV beam, 12 mm working distance 2.1 nm with 1 kV bean, 1.5 mm working distance Magnification High mag mode: 100x – 500 kx Low mag mode: 20x – 2 kx Electron Optics: Electron gun: Cold cathode field emission type …Electron Optics Facility Hitachi S-4700 FE-SEM FE-SEM Internal Components FE-SEM Internal Components Hitachi S-4700 FE-SEM Training Index Electron Gun Chamber Vacuum sealed chamber that contains the field emission gun. A pneumatic valve seals the gun chamber in the event of an accidental vacuum vent. Hitachi s 4700, [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1], [text-1-1]